2520 Pulse Laser Diode Testing System Keithley Sourcemeter Optical Instrument

• After-sales Service: Provide
• Warranty: Subject to The Contract
• Frequency Range: Contact Us
• Shipping Cost: Estimated freight per unit.: about shipping cost and estimated delivery time.
• Currency: US$
• Return&refunds: You can apply for a refund up to 30 days after receipt of the products.
• Model NO.: 2520
• Type: Desktop
• Channel: Contact Us
• Display: Contact Us
• Function: Test Measurement
• V/I Range: 100fa - 3A 100nv - 20V
• Accuracy: 0.015% 6.5 Digits
• Max Speed: 20K Readings/S to Buffer
• Power: 20 W
• Channels: 4
• Transport Package: Moisture-Proof and Anti-Collision
• Specification: Desktop
• Trademark: tektronix
• Origin: America

Product Description

Product Description

 

2520 Pulsed Laser Diode Test System

The Model 2520 Pulsed Laser Diode Test System is an integrated, synchronized system for testing laser diodes early in the manufacturing process, when proper temperature control cannot be easily achieved. The Model 2520 provides all sourcing and measurement capabilities needed for pulsed and continuous LIV (light-currentvoltage) testing of laser diodes in one compact, half-rack instrument. The tight synchronization of source and measure capabilities ensures high measurement accuracy, even when testing with pulse widths as short as 500ns.

Key Performance Specifications

• Simplifies laser diode LIV testing prior to packaging or active temperature control
• Integrated solution for in-process LIV production testing of laser diodes at the chip or bar level
• Sweep can be programmed to stop on optical power limit • Combines high accuracy source and measure capabilities for pulsed and DC testing
• Synchronized DSP based measurement channels ensure highly accurate light intensity and voltage measurements
• Programmable pulse on time from 500ns to 5ms up to 4% duty cycle
• Pulse capability up to 5A, DC capability up to 1A
• 14-bit measurement accuracy on three measurement channels (VF, front photodiode, back photodiode)
• Measurement algorithm increases the pulse measurement's signal-tonoise ratio
• Up to 1000-point sweep stored in buffer memory eliminates GPIB traffic during test, increasing throughput
• Digital I/O binning and handling operations
• IEEE-488 and RS -232 interfaces

Model overview

Model	Channels	Max Current Source/Measure Range	Max Voltage Source/Measure Range	Power	Measurement Resolution (Current / Voltage)	List Price
2510.	1	5A	10V	50 W	-	US $11,100 Configure & Quote
2510-AT	1	5A	10V	50 W	-	US $13,100 Configure & Quote
2520.	1	5A	10V	50 W	700nA / 0.33mV	US $48,900 Configure & Quote

Keithley instrumentation makes it easy to build a LIV (light-current-voltage) system to test laser diode modules cost-effectively.

• 2520 Pulse Laser Diode Test System: Synchronizing test system providing sourcing and measurement capability for pulsed and continuous LIV test.
• TEC SourceMeter SMUs, 2510 and 2510-AT: Ensure tight temperature control for laser diode modules by controlling its thermo-electric cooler.

Detailed Photos